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Scanning reflection electron microscopy study of surface defects in GaN films formed by epitaxial lateral overgrowth
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10.1063/1.1310631
/content/aip/journal/apl/77/12/10.1063/1.1310631
http://aip.metastore.ingenta.com/content/aip/journal/apl/77/12/10.1063/1.1310631
/content/aip/journal/apl/77/12/10.1063/1.1310631
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/content/aip/journal/apl/77/12/10.1063/1.1310631
2000-09-18
2014-12-19
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752b84549af89a08dbdd7fdb8b9568b5 journal.articlezxybnytfddd
Scitation: Scanning reflection electron microscopy study of surface defects in GaN films formed by epitaxial lateral overgrowth
http://aip.metastore.ingenta.com/content/aip/journal/apl/77/12/10.1063/1.1310631
10.1063/1.1310631
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