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Broad-area optical characterization of well-width homogeneity in multiple quantum wells grown on sapphire wafers
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10.1063/1.1334358
/content/aip/journal/apl/77/25/10.1063/1.1334358
http://aip.metastore.ingenta.com/content/aip/journal/apl/77/25/10.1063/1.1334358
/content/aip/journal/apl/77/25/10.1063/1.1334358
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/content/aip/journal/apl/77/25/10.1063/1.1334358
2000-12-18
2014-10-23
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752b84549af89a08dbdd7fdb8b9568b5 journal.articlezxybnytfddd
Scitation: Broad-area optical characterization of well-width homogeneity in GaN/AlxGa1−xN multiple quantum wells grown on sapphire wafers
http://aip.metastore.ingenta.com/content/aip/journal/apl/77/25/10.1063/1.1334358
10.1063/1.1334358
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