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Independent determination of Ge content in thin quantum wells by spectroscopic ellipsometry
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10.1063/1.126978
/content/aip/journal/apl/77/3/10.1063/1.126978
http://aip.metastore.ingenta.com/content/aip/journal/apl/77/3/10.1063/1.126978
/content/aip/journal/apl/77/3/10.1063/1.126978
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/content/aip/journal/apl/77/3/10.1063/1.126978
2000-07-17
2014-07-24
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752b84549af89a08dbdd7fdb8b9568b5 journal.articlezxybnytfddd
Scitation: Independent determination of Ge content in thin Si1−xGex quantum wells by spectroscopic ellipsometry
http://aip.metastore.ingenta.com/content/aip/journal/apl/77/3/10.1063/1.126978
10.1063/1.126978
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