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Dynamical analysis of the buildup process near resonance
1.T. C. L. G. Sollner, W. D. Goodhue, P. E. Tannenwald, C. D Parker, and D. D. Peck, Appl. Phys. Lett. 43, 588 (1983).
2.S. Luryi, Appl. Phys. Lett. 47, 490 (1985).
3.B. Ricco and M. Ya Azbel, Phys. Rev. B 29, 1970 (1984);
3.M. A. Talebian and W. Pötz, Appl. Phys. Lett. 69, 1148 (1996).
4.T. C. L. G. Sollner, E. R. Brown, W. D. Goodhue, and H. Q. Le, Appl. Phys. Lett. 50, 332 (1987);
4.M. Tsuchiya, T. Matsusue, and H. Sakaki, Phys. Rev. Lett. 59, 2356 (1987);
4.H. Yoshimura, J. N. Schulman, and H. Sakaki, Phys. Rev. Lett. 64, 2422 (1990).
5.Note that the shutter is a device that aids to visualize the initial condition and hence it is not part of the system.
6.This solution was obtained by one of the authors (J.V.) as an extension of the solution for the absorbing shutter introduced by G. Garcı́a-Calderón and A. Rubio, Phys. Rev. A 55, 3361 (1997).
7.G. Garcı́a-Calderón, R. Romo, and A. Rubio, Phys. Rev. B 50, 15142 (1994).
8.G. Garcı́a-Calderón and A. Rubio, Phys. Rev. A 55, 3361 (1997).
9.R. Romo and J. Villavicencio, Phys. Rev. B 60, R2142 (1999).
10.S. Luryi and A. Zaslavsky, in Modern Semiconductor Device Physics, edited by S. M. Sze (Wiley, New York, 1998), Chap. 5, pp. 253–342.
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