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Analysis of the activation energy of the subthreshold current in laser- and solid-phase-crystallized polycrystalline silicon thin-film transistors
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10.1063/1.127049
/content/aip/journal/apl/77/4/10.1063/1.127049
http://aip.metastore.ingenta.com/content/aip/journal/apl/77/4/10.1063/1.127049
/content/aip/journal/apl/77/4/10.1063/1.127049
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/content/aip/journal/apl/77/4/10.1063/1.127049
2000-07-24
2014-12-17
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752b84549af89a08dbdd7fdb8b9568b5 journal.articlezxybnytfddd
Scitation: Analysis of the activation energy of the subthreshold current in laser- and solid-phase-crystallized polycrystalline silicon thin-film transistors
http://aip.metastore.ingenta.com/content/aip/journal/apl/77/4/10.1063/1.127049
10.1063/1.127049
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