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Artifact-free near-field optical imaging by apertureless microscopy
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10.1063/1.127064
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    Affiliations:
    1 Istituto Nazionale per la Fisica della Materia, Unità di Pisa-Università, Via Buonarroti 2, I-56127 Pisa, Italy
    2 Istituto Nazionale per la Fisica della Materia and Dipartimento di Fisica MTFA, Università di Messina, Salita Sperone 31, I-98166 Messina, Italy
    3 Istituto Nazionale per la Fisica della Materia, Unità di Pisa-Università, Via Buonarroti 2, I-56127 Pisa, Italy
    Appl. Phys. Lett. 77, 621 (2000); http://dx.doi.org/10.1063/1.127064
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/content/aip/journal/apl/77/5/10.1063/1.127064
2000-07-31
2014-07-11
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752b84549af89a08dbdd7fdb8b9568b5 journal.articlezxybnytfddd
Scitation: Artifact-free near-field optical imaging by apertureless microscopy
http://aip.metastore.ingenta.com/content/aip/journal/apl/77/5/10.1063/1.127064
10.1063/1.127064
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