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Self-biased dielectric bolometer from epitaxially grown and lanthanum-doped multilayered thin films
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10.1063/1.1289064
/content/aip/journal/apl/77/7/10.1063/1.1289064
http://aip.metastore.ingenta.com/content/aip/journal/apl/77/7/10.1063/1.1289064
/content/aip/journal/apl/77/7/10.1063/1.1289064
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/content/aip/journal/apl/77/7/10.1063/1.1289064
2000-08-14
2014-11-27
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752b84549af89a08dbdd7fdb8b9568b5 journal.articlezxybnytfddd
Scitation: Self-biased dielectric bolometer from epitaxially grown Pb(Zr,Ti)O3 and lanthanum-doped Pb(Zr,Ti)O3 multilayered thin films
http://aip.metastore.ingenta.com/content/aip/journal/apl/77/7/10.1063/1.1289064
10.1063/1.1289064
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