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Huge differences between low- and high-angle twist grain boundaries: The case of ultrathin (001) Si films bonded to (001) Si wafers
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10.1063/1.1289656
/content/aip/journal/apl/77/8/10.1063/1.1289656
http://aip.metastore.ingenta.com/content/aip/journal/apl/77/8/10.1063/1.1289656
/content/aip/journal/apl/77/8/10.1063/1.1289656
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/content/aip/journal/apl/77/8/10.1063/1.1289656
2000-08-21
2014-07-28
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752b84549af89a08dbdd7fdb8b9568b5 journal.articlezxybnytfddd
Scitation: Huge differences between low- and high-angle twist grain boundaries: The case of ultrathin (001) Si films bonded to (001) Si wafers
http://aip.metastore.ingenta.com/content/aip/journal/apl/77/8/10.1063/1.1289656
10.1063/1.1289656
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