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Study of ultrathin interfaces by using scanning reflection electron microscopy and x-ray photoelectron spectroscopy
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10.1063/1.1355294
/content/aip/journal/apl/78/11/10.1063/1.1355294
http://aip.metastore.ingenta.com/content/aip/journal/apl/78/11/10.1063/1.1355294
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/content/aip/journal/apl/78/11/10.1063/1.1355294
2001-03-12
2014-07-10
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752b84549af89a08dbdd7fdb8b9568b5 journal.articlezxybnytfddd
Scitation: Scitation|Study of ultrathin Al2O3/Si(001) interfaces by using scanning reflection electron microscopy and x-ray photoelectron spectroscopy
http://aip.metastore.ingenta.com/content/aip/journal/apl/78/11/10.1063/1.1355294
10.1063/1.1355294
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