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Dual-probe scanning tunneling microscope: Measuring a carbon nanotube ring transistor
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10.1063/1.1371529
/content/aip/journal/apl/78/19/10.1063/1.1371529
http://aip.metastore.ingenta.com/content/aip/journal/apl/78/19/10.1063/1.1371529
/content/aip/journal/apl/78/19/10.1063/1.1371529
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/content/aip/journal/apl/78/19/10.1063/1.1371529
2001-05-07
2015-06-02
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752b84549af89a08dbdd7fdb8b9568b5 journal.articlezxybnytfddd
Scitation: Dual-probe scanning tunneling microscope: Measuring a carbon nanotube ring transistor
http://aip.metastore.ingenta.com/content/aip/journal/apl/78/19/10.1063/1.1371529
10.1063/1.1371529
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