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Determination of the thickness of Al oxide films used as barriers in magnetic tunneling junctions
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10.1063/1.1372619
/content/aip/journal/apl/78/20/10.1063/1.1372619
http://aip.metastore.ingenta.com/content/aip/journal/apl/78/20/10.1063/1.1372619
/content/aip/journal/apl/78/20/10.1063/1.1372619
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/content/aip/journal/apl/78/20/10.1063/1.1372619
2001-05-14
2014-11-24
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752b84549af89a08dbdd7fdb8b9568b5 journal.articlezxybnytfddd
Scitation: Determination of the thickness of Al oxide films used as barriers in magnetic tunneling junctions
http://aip.metastore.ingenta.com/content/aip/journal/apl/78/20/10.1063/1.1372619
10.1063/1.1372619
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