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Coulomb glass origin of defect-induced dielectric loss in thin-film oxides
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10.1063/1.1379984
/content/aip/journal/apl/78/25/10.1063/1.1379984
http://aip.metastore.ingenta.com/content/aip/journal/apl/78/25/10.1063/1.1379984
/content/aip/journal/apl/78/25/10.1063/1.1379984
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/content/aip/journal/apl/78/25/10.1063/1.1379984
2001-06-18
2014-07-25
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752b84549af89a08dbdd7fdb8b9568b5 journal.articlezxybnytfddd
Scitation: Coulomb glass origin of defect-induced dielectric loss in thin-film oxides
http://aip.metastore.ingenta.com/content/aip/journal/apl/78/25/10.1063/1.1379984
10.1063/1.1379984
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