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Erratum: “Robustness of ultrathin aluminum oxide dielectrics on Si(001)” [Appl. Phys. Lett. 78, 2670 (2001)]
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/content/aip/journal/apl/78/26/10.1063/1.1380681
2001-06-25
2014-10-20
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752b84549af89a08dbdd7fdb8b9568b5 journal.articlezxybnytfddd
Scitation: Erratum: “Robustness of ultrathin aluminum oxide dielectrics on Si(001)” [Appl. Phys. Lett. 78, 2670 (2001)]
http://aip.metastore.ingenta.com/content/aip/journal/apl/78/26/10.1063/1.1380681
10.1063/1.1380681
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