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Thermally stimulated current method applied on diodes with high concentration of deep trapping levels
1.U. Biggeri, E. Borchi, M. Bruzzi, Z. Li, and S. Lazanu, IEEE Trans. Nucl. Sci. 41, 964 (1994).
2.H. Feick, E. Fretwurst, P. Heydarpoor, G. Lindstroem, and M. Moll, Nucl. Instrum. Methods Phys. Res. A 388, 323 (1997).
3.M. Moll, H. Feick, E. Fretwurst, and G. Lindstroem, Nucl. Instrum. Methods Phys. Res. A 409, 194 (1998).
4.Michael Moll, PhD thesis, DESY, 1999.
5.L. Forbes and C. T. Sah, Solid-State Electron. 14, 182 (1971).
6.I. Pintilie, C. Tivarus, L. Pintilie, M. Moll, E. Fretwurst, and G. Lindstroem, Proceedings of the Second ENDEASD Workshop (Kista, Stockholm, Sweden, 27–29, June, 2000), edited by C. Claeys, pp. 79–88.
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