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Scanning near-field ellipsometric microscope-imaging ellipsometry with a lateral resolution in nanometer range
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10.1063/1.1403237
/content/aip/journal/apl/79/11/10.1063/1.1403237
http://aip.metastore.ingenta.com/content/aip/journal/apl/79/11/10.1063/1.1403237
/content/aip/journal/apl/79/11/10.1063/1.1403237
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/content/aip/journal/apl/79/11/10.1063/1.1403237
2001-09-10
2014-09-22
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752b84549af89a08dbdd7fdb8b9568b5 journal.articlezxybnytfddd
Scitation: Scanning near-field ellipsometric microscope-imaging ellipsometry with a lateral resolution in nanometer range
http://aip.metastore.ingenta.com/content/aip/journal/apl/79/11/10.1063/1.1403237
10.1063/1.1403237
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