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Investigation of oxidation mechanism for ohmic formation in Ni/Au contacts to p-type GaN layers
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10.1063/1.1425065
/content/aip/journal/apl/79/23/10.1063/1.1425065
http://aip.metastore.ingenta.com/content/aip/journal/apl/79/23/10.1063/1.1425065
/content/aip/journal/apl/79/23/10.1063/1.1425065
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/content/aip/journal/apl/79/23/10.1063/1.1425065
2001-12-03
2014-11-22
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752b84549af89a08dbdd7fdb8b9568b5 journal.articlezxybnytfddd
Scitation: Investigation of oxidation mechanism for ohmic formation in Ni/Au contacts to p-type GaN layers
http://aip.metastore.ingenta.com/content/aip/journal/apl/79/23/10.1063/1.1425065
10.1063/1.1425065
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