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Comment on “High-resolution electron microscopy investigations on stacking faults in ferroelectric thin films” [Appl. Phys. Lett. 78, 973 (2001)]
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2001-08-06
2014-07-24
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Scitation: Comment on “High-resolution electron microscopy investigations on stacking faults in SrBi2Ta2O9 ferroelectric thin films” [Appl. Phys. Lett. 78, 973 (2001)]
http://aip.metastore.ingenta.com/content/aip/journal/apl/79/6/10.1063/1.1390315
10.1063/1.1390315
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