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Metallized pyramidal silicon probe with extremely high throughput and resolution capability for optical near-field technology
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10.1063/1.1465520
/content/aip/journal/apl/80/13/10.1063/1.1465520
http://aip.metastore.ingenta.com/content/aip/journal/apl/80/13/10.1063/1.1465520
/content/aip/journal/apl/80/13/10.1063/1.1465520
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/content/aip/journal/apl/80/13/10.1063/1.1465520
2002-03-26
2015-03-05
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752b84549af89a08dbdd7fdb8b9568b5 journal.articlezxybnytfddd
Scitation: Metallized pyramidal silicon probe with extremely high throughput and resolution capability for optical near-field technology
http://aip.metastore.ingenta.com/content/aip/journal/apl/80/13/10.1063/1.1465520
10.1063/1.1465520
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