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Memory effects related to deep levels in metal–oxide–semiconductor structure with nanocrystalline Si
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10.1063/1.1467617
/content/aip/journal/apl/80/14/10.1063/1.1467617
http://aip.metastore.ingenta.com/content/aip/journal/apl/80/14/10.1063/1.1467617
/content/aip/journal/apl/80/14/10.1063/1.1467617
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/content/aip/journal/apl/80/14/10.1063/1.1467617
2002-04-02
2014-12-28
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752b84549af89a08dbdd7fdb8b9568b5 journal.articlezxybnytfddd
Scitation: Memory effects related to deep levels in metal–oxide–semiconductor structure with nanocrystalline Si
http://aip.metastore.ingenta.com/content/aip/journal/apl/80/14/10.1063/1.1467617
10.1063/1.1467617
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