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Oxygen-related dielectric relaxation and leakage characteristics of thin-film capacitors
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10.1063/1.1468259
/content/aip/journal/apl/80/14/10.1063/1.1468259
http://aip.metastore.ingenta.com/content/aip/journal/apl/80/14/10.1063/1.1468259
/content/aip/journal/apl/80/14/10.1063/1.1468259
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/content/aip/journal/apl/80/14/10.1063/1.1468259
2002-04-02
2014-10-30
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752b84549af89a08dbdd7fdb8b9568b5 journal.articlezxybnytfddd
Scitation: Oxygen-related dielectric relaxation and leakage characteristics of Pt/(Ba,Sr)TiO3/Pt thin-film capacitors
http://aip.metastore.ingenta.com/content/aip/journal/apl/80/14/10.1063/1.1468259
10.1063/1.1468259
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