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A method for measuring barrier heights, metal work functions and fixed charge densities in capacitors
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10.1063/1.1489098
/content/aip/journal/apl/80/25/10.1063/1.1489098
http://aip.metastore.ingenta.com/content/aip/journal/apl/80/25/10.1063/1.1489098
/content/aip/journal/apl/80/25/10.1063/1.1489098
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/content/aip/journal/apl/80/25/10.1063/1.1489098
2002-06-17
2014-10-31
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752b84549af89a08dbdd7fdb8b9568b5 journal.articlezxybnytfddd
Scitation: A method for measuring barrier heights, metal work functions and fixed charge densities in metal/SiO2/Si capacitors
http://aip.metastore.ingenta.com/content/aip/journal/apl/80/25/10.1063/1.1489098
10.1063/1.1489098
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