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Temperature-gradient epitaxy under in situ growth mode diagnostics by scanning reflection high-energy electron diffraction
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10.1063/1.1445483
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    Affiliations:
    1 Frontier Collaborative Research Center, Tokyo Institute of Technology, 4259 Nagatsuta, Midori, Yokohama 226-8503, Japan
    2 Frontier Collaborative Research Center, Tokyo Institute of Technology, 4259 Nagatsuta, Midori, Yokohama 226-8503, Japan
    3 Combinatorial Materials Exploration and Technology Corporation (COMET)
    4 CREST, Japan Science and Technology Corporation
    5 Department of Innovative and Engineering Materials, Tokyo Institute of Technology, 4259 Nagatsuta, Midori, Yokohama 226-8502, Japan
    6 Institute for Solid State Physics, University of Tokyo, Kashiwanoha 5-1-5, Kashiwa-shi, Chiba, 277-8581, Japan
    7 Combinatorial Materials Exploration and Technology Corporation (COMET)
    8 Institute for Materials Research, Tohoku University, 2-1-1 Katahira, Aoba, Sendai, 980-0812, Japan
    9 Combinatorial Materials Exploration and Technology Corporation (COMET)
    Appl. Phys. Lett. 80, 565 (2002); http://dx.doi.org/10.1063/1.1445483
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/content/aip/journal/apl/80/4/10.1063/1.1445483
2002-01-28
2014-08-28
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752b84549af89a08dbdd7fdb8b9568b5 journal.articlezxybnytfddd
Scitation: Temperature-gradient epitaxy under in situ growth mode diagnostics by scanning reflection high-energy electron diffraction
http://aip.metastore.ingenta.com/content/aip/journal/apl/80/4/10.1063/1.1445483
10.1063/1.1445483
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