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Real-time x-ray scattering study on the thermal evolution of interface roughness in formation
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10.1063/1.1455149
/content/aip/journal/apl/80/8/10.1063/1.1455149
http://aip.metastore.ingenta.com/content/aip/journal/apl/80/8/10.1063/1.1455149
/content/aip/journal/apl/80/8/10.1063/1.1455149
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/content/aip/journal/apl/80/8/10.1063/1.1455149
2002-02-25
2014-10-31
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752b84549af89a08dbdd7fdb8b9568b5 journal.articlezxybnytfddd
Scitation: Real-time x-ray scattering study on the thermal evolution of interface roughness in CoSi2 formation
http://aip.metastore.ingenta.com/content/aip/journal/apl/80/8/10.1063/1.1455149
10.1063/1.1455149
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