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Raman mapping investigations and finite element analysis of double epitaxial lateral overgrown GaN on sapphire substrates
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10.1063/1.1509860
/content/aip/journal/apl/81/13/10.1063/1.1509860
http://aip.metastore.ingenta.com/content/aip/journal/apl/81/13/10.1063/1.1509860
/content/aip/journal/apl/81/13/10.1063/1.1509860
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/content/aip/journal/apl/81/13/10.1063/1.1509860
2002-09-16
2014-08-29
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752b84549af89a08dbdd7fdb8b9568b5 journal.articlezxybnytfddd
Scitation: Raman mapping investigations and finite element analysis of double epitaxial lateral overgrown GaN on sapphire substrates
http://aip.metastore.ingenta.com/content/aip/journal/apl/81/13/10.1063/1.1509860
10.1063/1.1509860
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