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Erratum: “Characterization of GaAs/AlGaAs laser mesas regrown with semi-insulating GaInP by scanning capacitance microscopy” [Appl. Phys. Lett. 81, 960 (2002)]
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2002-10-15
2014-09-18
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752b84549af89a08dbdd7fdb8b9568b5 journal.articlezxybnytfddd
Scitation: Erratum: “Characterization of GaAs/AlGaAs laser mesas regrown with semi-insulating GaInP by scanning capacitance microscopy” [Appl. Phys. Lett. 81, 960 (2002)]
http://aip.metastore.ingenta.com/content/aip/journal/apl/81/17/10.1063/1.1517182
10.1063/1.1517182
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