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Correlation between interface traps and gate oxide leakage current in the direct tunneling regime
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10.1063/1.1492011
/content/aip/journal/apl/81/2/10.1063/1.1492011
http://aip.metastore.ingenta.com/content/aip/journal/apl/81/2/10.1063/1.1492011
/content/aip/journal/apl/81/2/10.1063/1.1492011
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/content/aip/journal/apl/81/2/10.1063/1.1492011
2002-06-27
2014-08-20
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752b84549af89a08dbdd7fdb8b9568b5 journal.articlezxybnytfddd
Scitation: Correlation between interface traps and gate oxide leakage current in the direct tunneling regime
http://aip.metastore.ingenta.com/content/aip/journal/apl/81/2/10.1063/1.1492011
10.1063/1.1492011
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