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Direct imaging of the depletion region of an InP junction under bias using scanning voltage microscopy
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10.1063/1.1528277
/content/aip/journal/apl/81/26/10.1063/1.1528277
http://aip.metastore.ingenta.com/content/aip/journal/apl/81/26/10.1063/1.1528277
/content/aip/journal/apl/81/26/10.1063/1.1528277
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/content/aip/journal/apl/81/26/10.1063/1.1528277
2002-12-17
2014-09-19
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752b84549af89a08dbdd7fdb8b9568b5 journal.articlezxybnytfddd
Scitation: Direct imaging of the depletion region of an InP p–n junction under bias using scanning voltage microscopy
http://aip.metastore.ingenta.com/content/aip/journal/apl/81/26/10.1063/1.1528277
10.1063/1.1528277
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