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Simulation of interface states effect on the scanning capacitance microscopy measurement of junctions
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10.1063/1.1532547
/content/aip/journal/apl/81/26/10.1063/1.1532547
http://aip.metastore.ingenta.com/content/aip/journal/apl/81/26/10.1063/1.1532547
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/content/aip/journal/apl/81/26/10.1063/1.1532547
2002-12-17
2014-04-16
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752b84549af89a08dbdd7fdb8b9568b5 journal.articlezxybnytfddd
Scitation: Simulation of interface states effect on the scanning capacitance microscopy measurement of p–n junctions
http://aip.metastore.ingenta.com/content/aip/journal/apl/81/26/10.1063/1.1532547
10.1063/1.1532547
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