1887
banner image
No data available.
Please log in to see this content.
You have no subscription access to this content.
No metrics data to plot.
The attempt to load metrics for this article has failed.
The attempt to plot a graph for these metrics has failed.
Analysis of interface roughness for thin gate oxides by scanning tunneling microscopy
Rent:
Rent this article for
USD
10.1063/1.1494124
/content/aip/journal/apl/81/3/10.1063/1.1494124
http://aip.metastore.ingenta.com/content/aip/journal/apl/81/3/10.1063/1.1494124
/content/aip/journal/apl/81/3/10.1063/1.1494124
Loading

Data & Media loading...

Loading

Article metrics loading...

/content/aip/journal/apl/81/3/10.1063/1.1494124
2002-07-02
2014-07-29
Loading

Full text loading...

This is a required field
Please enter a valid email address
This feature is disabled while Scitation upgrades its access control system.
This feature is disabled while Scitation upgrades its access control system.
752b84549af89a08dbdd7fdb8b9568b5 journal.articlezxybnytfddd
Scitation: Analysis of SiO2/Si(001) interface roughness for thin gate oxides by scanning tunneling microscopy
http://aip.metastore.ingenta.com/content/aip/journal/apl/81/3/10.1063/1.1494124
10.1063/1.1494124
SEARCH_EXPAND_ITEM