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High resolution magnetic force microscopy using focused ion beam modified tips
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10.1063/1.1497434
/content/aip/journal/apl/81/5/10.1063/1.1497434
http://aip.metastore.ingenta.com/content/aip/journal/apl/81/5/10.1063/1.1497434
/content/aip/journal/apl/81/5/10.1063/1.1497434
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/content/aip/journal/apl/81/5/10.1063/1.1497434
2002-07-22
2014-08-31
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752b84549af89a08dbdd7fdb8b9568b5 journal.articlezxybnytfddd
Scitation: High resolution magnetic force microscopy using focused ion beam modified tips
http://aip.metastore.ingenta.com/content/aip/journal/apl/81/5/10.1063/1.1497434
10.1063/1.1497434
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