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Characterization of GaAs/AlGaAs laser mesas regrown with semi-insulating GaInP by scanning capacitance microscopy
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10.1063/1.1491607
/content/aip/journal/apl/81/6/10.1063/1.1491607
http://aip.metastore.ingenta.com/content/aip/journal/apl/81/6/10.1063/1.1491607
/content/aip/journal/apl/81/6/10.1063/1.1491607
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/content/aip/journal/apl/81/6/10.1063/1.1491607
2002-07-30
2014-08-01
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752b84549af89a08dbdd7fdb8b9568b5 journal.articlezxybnytfddd
Scitation: Characterization of GaAs/AlGaAs laser mesas regrown with semi-insulating GaInP by scanning capacitance microscopy
http://aip.metastore.ingenta.com/content/aip/journal/apl/81/6/10.1063/1.1491607
10.1063/1.1491607
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