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Stress-induced effects on depletion-layer capacitance of metal–oxide–semiconductor capacitors
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10.1063/1.1630166
/content/aip/journal/apl/83/21/10.1063/1.1630166
http://aip.metastore.ingenta.com/content/aip/journal/apl/83/21/10.1063/1.1630166
/content/aip/journal/apl/83/21/10.1063/1.1630166
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/content/aip/journal/apl/83/21/10.1063/1.1630166
2003-11-18
2014-10-25
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752b84549af89a08dbdd7fdb8b9568b5 journal.articlezxybnytfddd
Scitation: Stress-induced effects on depletion-layer capacitance of metal–oxide–semiconductor capacitors
http://aip.metastore.ingenta.com/content/aip/journal/apl/83/21/10.1063/1.1630166
10.1063/1.1630166
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