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High frequency capacitance–voltage characterization of in fully depleted silicon-on-insulator metal–oxide–semiconductor capacitors
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10.1063/1.1579865
/content/aip/journal/apl/83/25/10.1063/1.1579865
http://aip.metastore.ingenta.com/content/aip/journal/apl/83/25/10.1063/1.1579865
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/content/aip/journal/apl/83/25/10.1063/1.1579865
2003-12-17
2014-04-16
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752b84549af89a08dbdd7fdb8b9568b5 journal.articlezxybnytfddd
Scitation: High frequency capacitance–voltage characterization of Al2O3/ZrO2/Al2O3 in fully depleted silicon-on-insulator metal–oxide–semiconductor capacitors
http://aip.metastore.ingenta.com/content/aip/journal/apl/83/25/10.1063/1.1579865
10.1063/1.1579865
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