Full text loading...
No data available.
Please log in to see this content.
You have no subscription access to this content.
No metrics data to plot.
The attempt to load metrics for this article has failed.
The attempt to plot a graph for these metrics has failed.
Effects of deep-level defects on ohmic contact and frequency performance of AlGaN/GaN high-electron-mobility transistors
Data & Media loading...
Article metrics loading...