1887
banner image
No data available.
Please log in to see this content.
You have no subscription access to this content.
No metrics data to plot.
The attempt to load metrics for this article has failed.
The attempt to plot a graph for these metrics has failed.
Formation of and defects in -irradiated or ion-implanted silicon containing boron
Rent:
Rent this article for
USD
10.1063/1.1595728
/content/aip/journal/apl/83/4/10.1063/1.1595728
http://aip.metastore.ingenta.com/content/aip/journal/apl/83/4/10.1063/1.1595728
/content/aip/journal/apl/83/4/10.1063/1.1595728
Loading

Data & Media loading...

Loading

Article metrics loading...

/content/aip/journal/apl/83/4/10.1063/1.1595728
2003-07-22
2014-09-01
Loading

Full text loading...

This is a required field
Please enter a valid email address
This feature is disabled while Scitation upgrades its access control system.
This feature is disabled while Scitation upgrades its access control system.
752b84549af89a08dbdd7fdb8b9568b5 journal.articlezxybnytfddd
Scitation: Formation of BiOi,BiCs, and BiBsHi defects in e-irradiated or ion-implanted silicon containing boron
http://aip.metastore.ingenta.com/content/aip/journal/apl/83/4/10.1063/1.1595728
10.1063/1.1595728
SEARCH_EXPAND_ITEM