Full text loading...
No data available.
Please log in to see this content.
You have no subscription access to this content.
No metrics data to plot.
The attempt to load metrics for this article has failed.
The attempt to plot a graph for these metrics has failed.
Arsenic penetration behavior and electrical characteristics of As-doped polycrystalline-silicon/high-k gate dielectric and films on Si (100) substrate
Data & Media loading...
Article metrics loading...