No data available.
Please log in to see this content.
You have no subscription access to this content.
No metrics data to plot.
The attempt to load metrics for this article has failed.
The attempt to plot a graph for these metrics has failed.
Analysis of plasma treatment and vapor heat treatment for thin-film transistors by extracting trap densities at front and back interfaces
1.M. Kimura, S. Inoue, and T. Shimoda, Extended Abstracts of The 63th Autumn Meeting, 2002, Niigata, Japan, September 2002 (The Japan Society of Applied Physics, Tokyo, Japan, 2002), p. 785.
2.M. Kimura, S. W.-B. Tam, S. Inoue, and T. Shimoda, Digest of AM-LCD ’03, Tokyo, Japan, July 2003 (The Japan Society of Applied Physics, Tokyo, Japan, 2003), p. 205.
3.M. Kimura, S. W.-B. Tam, S. Inoue, and T. Shimoda, Jpn. J. Appl. Phys., Part 1 43, 71 (2004).
4.H. Watakabe and T. Sameshima, IEEE Trans. Electron Devices 49, 2217 (2002).
5.H. Watakabe, Y. Tsunoda, N. Andoh, and T. Sameshima, J. Non-Cryst. Solids., Part B 299/302, 1321 (2002).
6.N. Sano, M. Sekiya, M. Hara, A. Kohno, and T. Sameshima, IEEE Electron Device Lett. 16, 157 (1995).
7.M. Kimura, D. Abe, S. W.-B. Tam, S. Inoue, and T. Shimoda, Proceedings of IDW ’03, Fukuoka, Japan, December 2003 (The Institute of Image Information and Television Engineers, Tokyo, Japan, and the Society for Information Display, San Jose, CA, 2003), p. 1669.
8.T. Sameshima, K. Saitoh, M. Sato, A. Tajima, and N. Takashima, Jpn. J. Appl. Phys., Part 2 36, L1360 (1997).
9.S. M. Sze, Semiconductor Devices, 2nd ed. (Wiley, New York, 2002), p. 456.
Article metrics loading...
Full text loading...
Most read this month
Most cited this month