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Analysis of plasma treatment and vapor heat treatment for thin-film transistors by extracting trap densities at front and back interfaces
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10.1063/1.1751215
/content/aip/journal/apl/84/20/10.1063/1.1751215
http://aip.metastore.ingenta.com/content/aip/journal/apl/84/20/10.1063/1.1751215
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/content/aip/journal/apl/84/20/10.1063/1.1751215
2004-05-05
2014-04-25
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752b84549af89a08dbdd7fdb8b9568b5 journal.articlezxybnytfddd
Scitation: Analysis of plasma treatment and vapor heat treatment for thin-film transistors by extracting trap densities at front and back interfaces
http://aip.metastore.ingenta.com/content/aip/journal/apl/84/20/10.1063/1.1751215
10.1063/1.1751215
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