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Origin and repartition of the oxide fixed charges generated by electrical stress in memory tunnel oxide
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10.1063/1.1756681
/content/aip/journal/apl/84/21/10.1063/1.1756681
http://aip.metastore.ingenta.com/content/aip/journal/apl/84/21/10.1063/1.1756681
/content/aip/journal/apl/84/21/10.1063/1.1756681
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/content/aip/journal/apl/84/21/10.1063/1.1756681
2004-05-07
2014-12-20
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752b84549af89a08dbdd7fdb8b9568b5 journal.articlezxybnytfddd
Scitation: Origin and repartition of the oxide fixed charges generated by electrical stress in memory tunnel oxide
http://aip.metastore.ingenta.com/content/aip/journal/apl/84/21/10.1063/1.1756681
10.1063/1.1756681
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