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Position noise in scanning superconducting quantum interference device microscopy
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10.1063/1.1763215
/content/aip/journal/apl/84/24/10.1063/1.1763215
http://aip.metastore.ingenta.com/content/aip/journal/apl/84/24/10.1063/1.1763215
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/content/aip/journal/apl/84/24/10.1063/1.1763215
2004-05-28
2014-04-18
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752b84549af89a08dbdd7fdb8b9568b5 journal.articlezxybnytfddd
Scitation: Position noise in scanning superconducting quantum interference device microscopy
http://aip.metastore.ingenta.com/content/aip/journal/apl/84/24/10.1063/1.1763215
10.1063/1.1763215
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