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High-resolution nanowire atomic force microscope probe grownby a field-emission induced process
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10.1063/1.1765202
/content/aip/journal/apl/84/25/10.1063/1.1765202
http://aip.metastore.ingenta.com/content/aip/journal/apl/84/25/10.1063/1.1765202
View: Figures

Figures

Image of FIG. 1.
FIG. 1.

(a) SEM image showing the orientation of the tip and the two etched tungsten sharp tips that are attached to the micromanipulators positioned for field-emission induced growth. (b) SEM image of a long tungsten nanowire tip. The tungsten nanowire appears much thicker than as-grown in the SEM image due to contamination during viewing.

Image of FIG. 2.
FIG. 2.

tapping mode images of a platinum thin film on silicon substrate using (a) a standard tapping mode tip (displayed height range ) and (b) a nanowire probe (displayed height range ). The scan area is .

Image of FIG. 3.
FIG. 3.

tapping mode images of a gold thin film on silicon substrate using a tungsten nanowire probe. (a) Image obtained at the start of one hour of continuous scanning. (b) Image obtained at the end of one hour of continuous scanning. (c) Image obtained on day 4 after storing the tungsten nanowire probe for 3 days. Displayed height range . The scan area is .

Image of FIG. 4.
FIG. 4.

Single line measurements obtained from tapping mode images of one side of the steep sidewall of the calibration grating using (a) a standard tapping mode tip and (b) a long tungsten nanowire probe. The cantilever is parallel to the grating lines, while the scanning is carried out in a perpendicular direction. The scan length is .

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/content/aip/journal/apl/84/25/10.1063/1.1765202
2004-06-10
2014-04-21
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752b84549af89a08dbdd7fdb8b9568b5 journal.articlezxybnytfddd
Scitation: High-resolution nanowire atomic force microscope probe grownby a field-emission induced process
http://aip.metastore.ingenta.com/content/aip/journal/apl/84/25/10.1063/1.1765202
10.1063/1.1765202
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