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Temperature stability of permittivity and dielectric relaxationin multilayered thin films of with a compositionally graded layer
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10.1063/1.1767605
/content/aip/journal/apl/84/26/10.1063/1.1767605
http://aip.metastore.ingenta.com/content/aip/journal/apl/84/26/10.1063/1.1767605
View: Figures

Figures

Image of FIG. 1.
FIG. 1.

X-ray diffraction patterns for the multilayered films on STN substrate.

Image of FIG. 2.
FIG. 2.

Temperature dependence of the dielectric constant for the multilayered films with different gradients of compositions.

Image of FIG. 3.
FIG. 3.

Temperature dependence of the dielectric constant and dielectric loss for multilayered film of .

Image of FIG. 4.
FIG. 4.

Arrhenius plots obtained from the dielectric loss peaks for the film of .

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/content/aip/journal/apl/84/26/10.1063/1.1767605
2004-06-17
2014-04-18
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752b84549af89a08dbdd7fdb8b9568b5 journal.articlezxybnytfddd
Scitation: Temperature stability of permittivity and dielectric relaxationin multilayered thin films of (Ba0.80Sr0.20)(Ti1−xZrx)O3with a compositionally graded layer
http://aip.metastore.ingenta.com/content/aip/journal/apl/84/26/10.1063/1.1767605
10.1063/1.1767605
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