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Nanoscopic electric potential probing: Influence of probe–sample interface on spatial resolution
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10.1063/1.1643534
/content/aip/journal/apl/84/4/10.1063/1.1643534
http://aip.metastore.ingenta.com/content/aip/journal/apl/84/4/10.1063/1.1643534
/content/aip/journal/apl/84/4/10.1063/1.1643534
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/content/aip/journal/apl/84/4/10.1063/1.1643534
2004-01-21
2014-10-23
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752b84549af89a08dbdd7fdb8b9568b5 journal.articlezxybnytfddd
Scitation: Nanoscopic electric potential probing: Influence of probe–sample interface on spatial resolution
http://aip.metastore.ingenta.com/content/aip/journal/apl/84/4/10.1063/1.1643534
10.1063/1.1643534
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