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Direct observation of contact and channel resistance in pentacene four-terminal thin-film transistor patterned by laser ablation method
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10.1063/1.1645316
/content/aip/journal/apl/84/5/10.1063/1.1645316
http://aip.metastore.ingenta.com/content/aip/journal/apl/84/5/10.1063/1.1645316
/content/aip/journal/apl/84/5/10.1063/1.1645316
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/content/aip/journal/apl/84/5/10.1063/1.1645316
2004-01-27
2015-04-01
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752b84549af89a08dbdd7fdb8b9568b5 journal.articlezxybnytfddd
Scitation: Direct observation of contact and channel resistance in pentacene four-terminal thin-film transistor patterned by laser ablation method
http://aip.metastore.ingenta.com/content/aip/journal/apl/84/5/10.1063/1.1645316
10.1063/1.1645316
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