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Vortex pinning arrays produced by nano-oxidation using an atomic force microscope
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10.1063/1.1768300
/content/aip/journal/apl/85/1/10.1063/1.1768300
http://aip.metastore.ingenta.com/content/aip/journal/apl/85/1/10.1063/1.1768300
View: Figures

Figures

Image of FIG. 1.
FIG. 1.

(a) AFM tip biasing circuit, simplified. The current limiting resistor must be placed as close to the tip as possible to avoid rapid discharge of the cable capacitance; (b) setpoint adjustment circuit. The controller voltage is modified manually to maintain a weak contact force between tip and sample.

Image of FIG. 2.
FIG. 2.

(Color) AFM images of thin film with anodized dots. (a) View showing full width of the thin film. Note the missing dot in the front left corner. (b) Magnified view of the anodized film. The dots are apart, and have a height of above the metal surface.

Image of FIG. 3.
FIG. 3.

ac voltage induced by vortices moving in a patterned thin film vs magnetic field , for dc currents between 0 and . Note the well developed kink at .

Image of FIG. 4.
FIG. 4.

Voltage due to vortex motion in patterned and unpatterned films at , . The additional current needed in the patterned film agrees well with the theoretical estimate outlined.

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/content/aip/journal/apl/85/1/10.1063/1.1768300
2004-06-29
2014-04-25
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752b84549af89a08dbdd7fdb8b9568b5 journal.articlezxybnytfddd
Scitation: Vortex pinning arrays produced by nano-oxidation using an atomic force microscope
http://aip.metastore.ingenta.com/content/aip/journal/apl/85/1/10.1063/1.1768300
10.1063/1.1768300
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