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Thickness scaling of polycrystalline films downto prepared by metalorganic chemical vapor depositionhaving good ferroelectric properties
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10.1063/1.1781354
/content/aip/journal/apl/85/10/10.1063/1.1781354
http://aip.metastore.ingenta.com/content/aip/journal/apl/85/10/10.1063/1.1781354
/content/aip/journal/apl/85/10/10.1063/1.1781354
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/content/aip/journal/apl/85/10/10.1063/1.1781354
2004-09-13
2014-11-24
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752b84549af89a08dbdd7fdb8b9568b5 journal.articlezxybnytfddd
Scitation: Thickness scaling of polycrystalline Pb(Zr,Ti)O3 films downto 35nm prepared by metalorganic chemical vapor depositionhaving good ferroelectric properties
http://aip.metastore.ingenta.com/content/aip/journal/apl/85/10/10.1063/1.1781354
10.1063/1.1781354
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