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Schematic shows the experimental setup. In our studies, both the up and down surfaces of the semiconductor wafers are covered with .
(a) SEM and (b) TEM with SAED pattern images of the obtained nanowires. The inset of (a) is a SEM image showing the surface morphology.
TEM image of an obtained nanowire, where the insets are the SEM image and SAED pattern.
(a) TEM image of an obtained nanowire, where the insets are the SEM image and SAED pattern; (b) EDS of a single nanowire.
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