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Superconducting transition edge sensor using dilute AlMn alloys
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10.1063/1.1789575
/content/aip/journal/apl/85/11/10.1063/1.1789575
http://aip.metastore.ingenta.com/content/aip/journal/apl/85/11/10.1063/1.1789575
View: Figures

Figures

Image of FIG. 1.
FIG. 1.

(a) Dependence of in Al on Mn concentration. (b) Optical micrograph of an Al–Mn TES.

Image of FIG. 2.
FIG. 2.

(a) Noise of the Al–Mn TES detector. (b) x-ray pulse in the detector.

Image of FIG. 3.
FIG. 3.

The ratio of the change in TES resistance with field to resistance without vs the resistance of the device at bias (normalized to , the normal state resistance).

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/content/aip/journal/apl/85/11/10.1063/1.1789575
2004-09-17
2014-04-21
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752b84549af89a08dbdd7fdb8b9568b5 journal.articlezxybnytfddd
Scitation: Superconducting transition edge sensor using dilute AlMn alloys
http://aip.metastore.ingenta.com/content/aip/journal/apl/85/11/10.1063/1.1789575
10.1063/1.1789575
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