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(a) SEM image of the surface topology of a shock-consolidated compact, revealing an array of shear bands with a bright contrast edge corresponding to the offset. Shear bands marked “” and “” also reveal a dark contrast shadow caused by the band offset on the adjacent surface. (b) TEM micrograph showing a region with two shear bands (bright contrast) in shock-consolidated nanocomposite, present in the interior of powder particles.
TEM micrograph of typical region away from shear band showing the absence of any defects such as dislocations, stacking faults, and twins, in shock-consolidated nanocomposite compact.
(a) TEM micrograph showing a shear band passing through multiple nanosized grains resulting in truncation and the further reduction in size of preexisting grains. The inset shows the TEM dark-field image of the dark contrast grain in (a), revealing that it does not extend into the shear band region. (b) Higher magnification TEM image of region marked in (a) shows presence of amorphous phase inside shear band along with dark contrast crystallites, as well as the interruption of fringes of phase grain.
(a) TEM image showing truncation of multiple nanograins by a shear band. Black arrows mark the flat, sharp interface between undeformed area and shear band region. (b) TEM dark-field image of area within shear band in (a) showing amorphous phase and ultrafine nanograins.
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