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Scanning laser imaging of dissipation in -coated conductors
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10.1063/1.1794377
/content/aip/journal/apl/85/13/10.1063/1.1794377
http://aip.metastore.ingenta.com/content/aip/journal/apl/85/13/10.1063/1.1794377
View: Figures

Figures

Image of FIG. 1.
FIG. 1.

(a) Zero field cooled magneto-optical image measured at , . The narrow light horizontal line is due to domain structure in the imaging film. (b) response measured in low temperature scanning laser microscope at and the bias current , the averaged electric field . The maximum response amplitude is . Scanning step is .

Image of FIG. 2.
FIG. 2.

map in the vicinity of the defect described at , and , where is the response measured far away from the defect. The inset shows calculated by the hodograph method with , where is the electric field at infinity (Ref. 5).

Image of FIG. 3.
FIG. 3.

(a)–(d) responses measured at different bias currents at . The bias current is applied in the horizontal direction. Legend for corresponds to the image (d); (e)–(h) GB misorientation maps; (i) -axis misorientation map. Legend with angle limits corresponds to image (i).

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/content/aip/journal/apl/85/13/10.1063/1.1794377
2004-09-28
2014-04-20
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752b84549af89a08dbdd7fdb8b9568b5 journal.articlezxybnytfddd
Scitation: Scanning laser imaging of dissipation in YBa2Cu3O7−δ-coated conductors
http://aip.metastore.ingenta.com/content/aip/journal/apl/85/13/10.1063/1.1794377
10.1063/1.1794377
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