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Electromigration-induced microstructure evolution in tin studied by synchrotron x-ray microdiffraction
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10.1063/1.1795353
/content/aip/journal/apl/85/13/10.1063/1.1795353
http://aip.metastore.ingenta.com/content/aip/journal/apl/85/13/10.1063/1.1795353
View: Figures

Figures

Image of FIG. 1.
FIG. 1.

(a) High density of (100) poles in the center of the figure along the sample normal ( axis) direction. (b) Distribution of (001) poles along the equator along the sample transverse ( axis) direction.

Image of FIG. 2.
FIG. 2.

Grain maps of tin stripes angle: (a) as-received sample and (b) after electromigration. The grey scale refers to the angle between the axis and the projection of (100) on plane.

Image of FIG. 3.
FIG. 3.

Schematic diagram of a large angle grain boundary. The arrow indicates the direction of electron flow.

Image of FIG. 4.
FIG. 4.

Sn line stressed with at . Grains indicated by arrows grew asymmetrically in the same direction as electron flow.

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/content/aip/journal/apl/85/13/10.1063/1.1795353
2004-09-28
2014-04-18
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752b84549af89a08dbdd7fdb8b9568b5 journal.articlezxybnytfddd
Scitation: Electromigration-induced microstructure evolution in tin studied by synchrotron x-ray microdiffraction
http://aip.metastore.ingenta.com/content/aip/journal/apl/85/13/10.1063/1.1795353
10.1063/1.1795353
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